paraphrase

ENGR 1210 SEM Lab Report Name:

ENGR 1210 Lab Report 2: SEM Lab

1. Objective: The objective of this lab session is to observe a metal sample with a Scanning Electron Microscope (SEM).

2. Equipment used: (Technical specifications)

Equipment name	Model/technical specs	Function/property
FIB microscope	Acceleration voltage = 15kv Working distance= 12mm	To observe sample surface
SE detector	--------------------------------	To form image
EDS detector	--------------------------------	Collect X-rays
Copper tape	¼ wide	To make sample conductive

3. Sample preparation

· Sample was prepared using standard metallography technique involving acting, grinding, polishing, and etching.

· Copper tapes were applied to make sample conductive.

4. Experimental/testing procedure

5. Results, observations, and discussions

6. Conclusion

Important Notes:

· Sections 1 through 4 are common for a group whereas section 5 and 6 are individually written by each student.

· Only documents submitted as doc docx or pdf will be graded

· Include your first and last name in document heading next to Name:

· Delete these formatting notes before submitting

Objective: Observe metal sample specimen with a SEM. Compare and contrast with observations under light microscope (Lab 1)

Tools provided: Hitachi VP-SEM S3400N


Sample preparation:

A) Sample needs to be prepared following metallography techniques (Lab 1) for bulk scale samples and using Carbon tape for nanoscale samples.

B) Make note of each sample material shown by the SEM Operator. Wear gloves at all times to avoid any contamination with the sample.

C) When mounting sample test specimens to the stub, sterile gloves should be worn. The sample test specimen should be mounted to the stub using proper amounts of conductive paste or double sided tape.

Operating and testing:

A) Perform all necessary start up checks.

B) Locate the EVAC Panel and turn key to start.

C) Log into computer with appropriate user name and password

D) To load a prepared and mounted sample test specimen first make sure the accelerated voltage is off and the specimen chamber is not under vacuum. Both of these controls are located on the control panel. Wait 2 minutes for the chamber to return to atmospheric pressure. Locate handle on front side of specimen stage and pull to remove specimen base. Locate specimen holder receptacle on specimen stage. Slide specimen base into holder. Push handle to move stage into specimen chamber. Press EVAC button to bring the chamber under pressure.

E) Wait two minutes and engage accelerating voltage. The control for the acceleration voltage is located on the control panel. The voltage settings (Kv) can be adjusted by the operator prior to engaging.

F) Testing device parameters for the detector(s) will be set by the SEM Operator.

G) After scan is completed by the testing device. An image will appear on the computer screen. The operator will adjust the settings for best image quality.

H) Repeat all sample preparation steps and experiment steps D – G recording the images generated with test specimens, the testing device readings, and descriptions and pictures/sketches of each sample material tested.

Results and discussion:

I saw the SEM machine(X-Ray) it was huge and complicated for me. The instructor of that lab was very professional in how to use that machine. Dr. Bedakar and She explained the parts that are in the machine and what each component does. Also I saw some images of the grain structure of the surface we were discovering at that lab and how deep she went through the part.

The sample is placed on the stage within the specimen chamber. The chamber is sealed allowing the procedure to be conducted under pressure or vacuum. Detectors vary in form and function. The S-3400N is equipped with two detectors: Everhardt Thornley Secondary Electrons (SE) Detector and the High Sensitivity Semiconductor Back Scatter Electron (BSE) Detector. Fundamentally, detectors measure how an electron reacts after colliding the sample. The information observed by the detector is then transmitted to the GUI, most typically a computer with system specific software

Conclusion:

SME was used to get clearer and to see more bright pictuers of the grain structure of the sample. It has a really good lenses which are very charged it also gives colors to the pictures. We were able to see the grain lines that we cant see them with out the SME.